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In situ pre-growth calibration using reflectance as a control strategy for MOCVD fabrication of device structures
William G. Breiland, Hong Q. Hou, Herman C. Chui, Burrel E. HammonsVolume:
174
Year:
1997
Language:
english
Pages:
8
DOI:
10.1016/s0022-0248(97)00020-1
File:
PDF, 581 KB
english, 1997