Surfactant influence on the Ge heteroepilayer on Si(0 0 1) studied by X-ray diffraction and atomic force microscopy
Haijun Zhu, Zuimin Jiang, Amei Xu, Mingchun Mao, Dongzhi Hu, Xiangjiu Zhang, Xiaohan Liu, Daming Huang, Xun Wang, Jielin Sun, Minqian Li, Xiaoming JiangVolume:
179
Year:
1997
Language:
english
Pages:
5
DOI:
10.1016/s0022-0248(97)00099-7
File:
PDF, 660 KB
english, 1997