Spectroscopic ellipsometry study on initial growth stages...

Journal of Crystal Growth 1998 / 6 Vol. 189-190

Spectroscopic ellipsometry study on initial growth stages of GaN films on GaAs(001) in low-pressure MOVPE

Taniyasu, Yoshitaka, Ito, Ryouichi, Shimoyama, Norio, Kurihara, Megumi, Jia, Anwei, Kato, Yoshinori, Kobayashi, Masakazu, Yoshikawa, Akihiko, Takahashi, Kiyoshi
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Volume:
189-190
Language:
english
Pages:
5
Journal:
Journal of Crystal Growth
DOI:
10.1016/s0022-0248(98)00271-1
Date:
June, 1998
File:
PDF, 151 KB
english, 1998
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