![](/img/cover-not-exists.png)
Structural study of metastable (GaAs)1−X(Ge2)X thin films grown by RF magnetron sputtering
B. Salazar-Hernández, M.A. Vidal, M.E. Constantino, H. Navarro-Contreras, R. Asomoza, A. MerkulovVolume:
197
Year:
1999
Language:
english
Pages:
6
DOI:
10.1016/s0022-0248(98)00958-0
File:
PDF, 166 KB
english, 1999