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Investigations by high-resolution X-ray diffraction (HRXRD) and transmission electron microscopy (TEM) of (BeTe/ZnSe) superlattices grown by molecular beam epitaxy onto GaAs buffer epilayer
V Bousquet, M Laügt, P Vennéguès, E Tournié, J.-P FaurieVolume:
201-202
Year:
1999
Language:
english
Pages:
4
DOI:
10.1016/s0022-0248(98)01385-2
File:
PDF, 265 KB
english, 1999