Precise growth of high uniformity vertical cavity devices...

Precise growth of high uniformity vertical cavity devices using tunable dynamic optical reflectometry

F Van Dijk, V Bardinal, C Fontaine, E Bedel-Pereira, A Muñoz-Yagüe
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Volume:
201-202
Year:
1999
Language:
english
Pages:
4
DOI:
10.1016/s0022-0248(98)01514-0
File:
PDF, 79 KB
english, 1999
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