Measurements by X-ray topography of the critical thickness of ZnSe grown on GaAs
C.B. O'Donnell, G. Lacey, G. Horsburgh, A.G. Cullis, C.R. Whitehouse, P.J. Parbrook, W. Meredith, I. Galbraith, P. Möck, K.A. Prior, B.C. CavenettVolume:
184-185
Year:
1998
Language:
english
Pages:
5
DOI:
10.1016/s0022-0248(98)80301-1
File:
PDF, 390 KB
english, 1998