Characterization of defect structures in nanocrystalline materials by X-ray line profile analysis
Gubicza, Jenõ, Ungár, TamásVolume:
222
Language:
english
Journal:
Zeitschrift für Kristallographie
DOI:
10.1524/zkri.2007.222.11.567
Date:
January, 2007
File:
PDF, 1.61 MB
english, 2007