Study on defects in EMCZ-Si crystal by infrared light...

Journal of Crystal Growth 2000 Vol. 208; Iss. 1-4

Study on defects in EMCZ-Si crystal by infrared light scattering tomography

Minya Ma, Nobuhito Nango, Tomoya Ogawa, Masahito Watanabe, Minoru Eguchi
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Volume:
208
Year:
2000
Language:
english
Pages:
7
DOI:
10.1016/s0022-0248(99)00477-7
File:
PDF, 358 KB
english, 2000
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