Quantitative image analysis of superconductor thin film microstructure: The use of conditional, multiparametric, shape-analysis algorithms
Amato, Philip A., Lelental, Mark, Bowen, Ray C.Volume:
8
Language:
english
Journal:
Journal of Materials Research
DOI:
10.1557/jmr.1993.2799
Date:
November, 1993
File:
PDF, 2.77 MB
english, 1993