Investigation of low- and high-resistance Ni–Ge–Au ohmic contacts to n+ GaAs using electron microbeam and surface analytical techniques
Lumpkin, Nancy E., Lumpkin, Gregory R., Butcher, K. S. A.Volume:
11
Language:
english
Journal:
Journal of Materials Research
DOI:
10.1557/jmr.1996.0159
Date:
May, 1996
File:
PDF, 608 KB
english, 1996