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Reverse polarity effect from effective charge disparity during electromigration in eutectic Sn–Zn solder interconnect
Zhang, X.F., Guo, J.D., Shang, J.K.Volume:
23
Language:
english
Journal:
Journal of Materials Research
DOI:
10.1557/jmr.2008.0413
Date:
December, 2008
File:
PDF, 713 KB
english, 2008