Importance of line and interfacial energies during VLS...

Importance of line and interfacial energies during VLS growth of finely stranded silica nanowires

Bettge, Martin, MacLaren, Scott, Burdin, Steve, Abraham, Daniel, Petrov, Ivan, Yu, Min-Feng, Sammann, Ernie
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Volume:
26
Language:
english
Journal:
Journal of Materials Research
DOI:
10.1557/jmr.2011.151
Date:
September, 2011
File:
PDF, 266 KB
english, 2011
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