Importance of line and interfacial energies during VLS growth of finely stranded silica nanowires
Bettge, Martin, MacLaren, Scott, Burdin, Steve, Abraham, Daniel, Petrov, Ivan, Yu, Min-Feng, Sammann, ErnieVolume:
26
Language:
english
Journal:
Journal of Materials Research
DOI:
10.1557/jmr.2011.151
Date:
September, 2011
File:
PDF, 266 KB
english, 2011