Observation of Ge2Sb2Te5 thin film phase transition behavior according to the number of cycles using Transmission Electron Microscope and Scanning Probe Microscope
Kim, Hyunjung, Choi, Sikyung, Kang, Sukhoon, Oh, Kyuhwan, Kweon, SoonyongVolume:
961
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-0961-o03-04
Date:
January, 2006
File:
PDF, 3.22 MB
english, 2006