Characterization of Local Electrical Property of...

MRS Proceedings 2007 / 1 Vol. 1025

Characterization of Local Electrical Property of Coincidence Site Lattice Boundary in Location-controlled Silicon Islands by Scanning Probe Microscopy

Matsuki, Nobuyuki, Ishihara, R., Baiano, A., Hiroshima, Y., Inoue, S., Beenakker, C.I.M.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
1025
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-1025-b16-16
Date:
January, 2007
File:
PDF, 3.86 MB
english, 2007
Conversion to is in progress
Conversion to is failed