Fundraising September 15, 2024 – October 1, 2024 About fundraising

Strain measurements in s-Si/SiGe nanostructures by...

Strain measurements in s-Si/SiGe nanostructures by quantitative high-resolution electron microscopy

Hüe, Florian, Hÿtch, Martin, Bender, Hugo, Hartmann, Jean-Michel, Claverie, Alain
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
1026
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-1026-c20-04
Date:
January, 2007
File:
PDF, 5.28 MB
english, 2007
Conversion to is in progress
Conversion to is failed