Large-Scale Electromigration Statistics for Cu...

MRS Proceedings 2009 / 1 Vol. 1156

Large-Scale Electromigration Statistics for Cu Interconnects

Hauschildt, Meike, Gall, Martin, Hernandez, Richard
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Volume:
1156
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-1156-d06-06
Date:
January, 2009
File:
PDF, 725 KB
english, 2009
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