Incorporation of Extrinsic Defects in HgI2 During Detector Fabrication
Van Scyoc, J.M., Schlesinger, T.E., James, R.B., Cheng, A.Y., Ortale, C., van den Berg, L.Volume:
302
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-302-115
Date:
January, 1993
File:
PDF, 332 KB
english, 1993