Incorporation of Extrinsic Defects in HgI2 During Detector...

Incorporation of Extrinsic Defects in HgI2 During Detector Fabrication

Van Scyoc, J.M., Schlesinger, T.E., James, R.B., Cheng, A.Y., Ortale, C., van den Berg, L.
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Volume:
302
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-302-115
Date:
January, 1993
File:
PDF, 332 KB
english, 1993
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