Density of States Extraction in Bulk Channel Area of a-Si:H Thin-Film Transistors by Using Low-Frequency Noise Analysis
Lee, Kyunghwan, Son, Younghwan, Lee, Jaeho, Lee, Jaehong, Jang, Seunghyun, Park, Jung Jin, Kim, Shinhyung, Shin, Hyung CheolVolume:
378-379
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/amr.378-379.642
Date:
October, 2011
File:
PDF, 316 KB
english, 2011