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Characterization of Metal-Semiconductor Schottky Diodes and Application on THz Detection
Liu, Hai Rui, Yu, Jun ShengVolume:
683
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/amr.683.729
Date:
April, 2013
File:
PDF, 279 KB
english, 2013