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Voltammetric verification of the Hush-Blackledge equation for the electron repulsion energy
Tetsuo Saji, Shigeru AoyaguiVolume:
144
Year:
1983
Language:
english
Pages:
10
DOI:
10.1016/s0022-0728(83)80152-1
File:
PDF, 416 KB
english, 1983