Depth Resolved and Elemental Selective XRF and XAS in Surface Layer of Annealed Fe-Cr Alloys
Shinoda, Kozo, Sato, S., Suzuki, Shigeru, Toyokawa, Hidenori, Tanida, Hajime, Uruga, TomoyaVolume:
297-301
Language:
english
Journal:
Defect and Diffusion Forum
DOI:
10.4028/www.scientific.net/ddf.297-301.859
Date:
April, 2010
File:
PDF, 667 KB
english, 2010