Depth-Profiling of Phase Composition and Texture in...

Key Engineering Materials 2002 Vol. 224-226

Depth-Profiling of Phase Composition and Texture in Layered-Graded Al2O3- & Ti3SiC2-Based Systems Using X-Ray and Synchrotron Radiation Diffraction

Low, I.M., Singh, M., Manurung, P., Wren, E., Sheppard, D.P., Barsoum, M.W.
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Volume:
224-226
Year:
2002
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/kem.224-226.505
File:
PDF, 455 KB
2002
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