Nanofractography of Alumina by Scanning Probe Microscopy
Tatami, Junichi, Ohbuchi, Tomoko, Komeya, Katsutoshi, Meguro, TakeshiVolume:
290
Year:
2005
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/kem.290.70
File:
PDF, 696 KB
english, 2005