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Influence of Schottky Interfaces on Dielectric Properties in Perovskite-Type Oxide Thin-Film Capacitors
Horiuchi, Naohiro, Hoshina, Takuya, Takeda, Hiroaki, Tsurumi, TakaakiVolume:
485
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/kem.485.203
Date:
July, 2011
File:
PDF, 270 KB
english, 2011