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Phonon Spectroscopy of Defects Correlated with the Diffusion of Zn into Si
Staiger, J., Gross, P., Lassmann, K., Bracht, H., Stolwijk, NicolaasVolume:
143-147
Year:
1994
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.143-147.675
File:
PDF, 342 KB
1994