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An ab initio Study of Native Defects in Cubic SiC: Vacancies and Stacking Faults
Zywietz, A., Käckell, P., Furthmüller, J., Bechstedt, FriedhelmVolume:
264-268
Year:
1998
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.264-268.283
File:
PDF, 316 KB
english, 1998