Application of the Distorted-Wave Born Approximation to Interface Characterization in W/Si Multilayer Thin Films
Jergel, Matej, Holý, V., Senderák, R., Majková, E., Luby, S.Volume:
278-281
Year:
1998
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.278-281.454
File:
PDF, 410 KB
1998