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Raman Spectroscopy on Biaxially Strained Epitaxial Layers of 3C-SiC on Si
Rohmfeld, S., Hundhausen, Martin, Ley, Lothar, Zorman, Christian A., Mehregany, M.Volume:
338-342
Year:
2000
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.338-342.595
File:
PDF, 329 KB
english, 2000