EPR Study of Electron Irradiation-Induced Defects in Semi-Insulating SiC:V
von Bardeleben, Hans Jürgen, Cantin, J.L., Reshanov, Sergey A., Rastegaev, V.P.Volume:
433-436
Year:
2003
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.433-436.507
File:
PDF, 195 KB
english, 2003