Radiotracer Investigation of Gadolinium Induced Deep Levels in Hexagonal Silicon Carbide
Pasold, G., Albrecht, F., Hülsen, C., Sielemann, R., Zeitz, W.-D., Witthuhn, W.Volume:
457-460
Year:
2004
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.457-460.783
File:
PDF, 493 KB
english, 2004