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Electrical Method to Study the Weak Molecular Movements at Nanometric Scale in Low Mobility Materials
Neagu, Eugen R., Neagu, R.M., Dias, C.J., Lança, M.C., Inácio, Paulo, Marat-Mendes, José N.Volume:
636-637
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.636-637.430
Date:
January, 2010
File:
PDF, 432 KB
english, 2010