Current Transient Effect in N-Channel 6H-SiC MOSFET Induced...

Materials Science Forum 2010 / 4 Vol. 645-648

Current Transient Effect in N-Channel 6H-SiC MOSFET Induced by Heavy Ion Irradiation

Lee, Kin Kiong, Laird, Jamie Steward, Ohshima, Takeshi, Onoda, Shinobu, Hirao, Toshio, Itoh, Hisayoshi
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Volume:
645-648
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.645-648.1013
Date:
April, 2010
File:
PDF, 533 KB
english, 2010
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