Correlation between Leakage Current and Stacking Fault...

Materials Science Forum 2010 / 4 Vol. 645-648

Correlation between Leakage Current and Stacking Fault Density of p-n Diodes Fabricated on 3C-SiC

Kawahara, Takamitsu, Hatta, Naoki, Yagi, Kuniaki, Uchida, Hidetsugu, Kobayashi, Motoki, Abe, Masayuki, Nagasawa, Hiroyuki, Zippelius, Bernd, Pensl, Gerhard
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Volume:
645-648
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.645-648.339
Date:
April, 2010
File:
PDF, 933 KB
english, 2010
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