Influence of Processing and of Material Defects on the...

Materials Science Forum 2010 / 4 Vol. 645-648

Influence of Processing and of Material Defects on the Electrical Characteristics of SiC-SBDs and SiC-MOSFETs

Fukuda, Kenji, Kinoshita, Akimasa, Ohyanagi, Takasumi, Kosugi, Ryouji, Sakata, T., Sakuma, Y., Senzaki, Junji, Minami, A., Shimozato, Atsushi, Suzuki, Takuma, Hatakeyama, Tetsuo, Shinohe, Takashi, Mat
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Volume:
645-648
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.645-648.655
Date:
April, 2010
File:
PDF, 1.10 MB
english, 2010
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