High-Performance Multi-Wafer SiC Epitaxy – First Results of...

High-Performance Multi-Wafer SiC Epitaxy – First Results of Using a 10x100mm Reactor

Hecht, Christian, Stein, René A., Thomas, Bernd, Wehrhahn-Kilian, Larissa, Rosberg, Jonas, Kitahata, Hiroya, Wischmeyer, Frank
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Volume:
645-648
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.645-648.89
Date:
April, 2010
File:
PDF, 729 KB
english, 2010
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