Demonstration of SiC Vertical Trench JFET Reliability

Materials Science Forum 2012 / 5 Vol. 717-720

Demonstration of SiC Vertical Trench JFET Reliability

Speer, Kevin M., Chatty, Kiran, Bondarenko, Volodymyr, Sheridan, David C., Matocha, Kevin, Casady, Jeff B.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
717-720
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.717-720.1017
Date:
May, 2012
File:
PDF, 911 KB
english, 2012
Conversion to is in progress
Conversion to is failed