Effects of Lattice Defects on Degradation of Flash Memory Cell
Kobayashi, K., Ohyama, H., Nakabayashi, Masashi, Simoen, Eddy, Claeys, C., Kudou, K., Yoneoka, M., Hayama, K., Kohiki, S.Volume:
78-79
Year:
2001
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/ssp.78-79.231
File:
PDF, 284 KB
2001