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In-situ ellipsometry and SHG measurements of the growth of CdS layers on CdxHg1−xTe
A. Wark, L.E.A. Berlouis, F. Jackson, S. Lochran, F.R. Cruickshank, P.F. BrevetVolume:
435
Year:
1997
Language:
english
Pages:
6
DOI:
10.1016/s0022-0728(97)00302-1
File:
PDF, 825 KB
english, 1997