A Simple Circuit to Investigate Threshold Voltage Variation...

A Simple Circuit to Investigate Threshold Voltage Variation and Its Application in Monitoring Negative Bias Temperature Instability Degradation

Hong, Jie, He, Yandong, Zhang, Ganggang, Zhang, Xing
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Volume:
52
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/jjap.52.04cc06
Date:
April, 2013
File:
PDF, 268 KB
english, 2013
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