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Mechanical characterization of sub-100-nm-thick Au thin films by electrostatically actuated tensile testing with several strain rates
Oh, Hyun-Jin, Kawase, Shinya, Hanasaki, Itsuo, Isono, YoshitadaVolume:
53
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/jjap.53.027201
Date:
February, 2014
File:
PDF, 1.01 MB
english, 2014