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A Flexibly Fault-Tolerant FU Array Processor and its Self-Tuning Scheme to Locate Permanently Defective Unit
Yao, Jun, Nakashima, Yasuhiko, Saito, Mitsutoshi, Hazama, Yohei, Yamanaka, RyosukeYear:
2015
Language:
english
Journal:
IEEE Micro
DOI:
10.1109/MM.2015.1
File:
PDF, 506 KB
english, 2015