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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - San Jose, CA (Sunday 18 January 2009)] Wavelet Applications in Industrial Processing VI - Image blur estimation based on the average cone of ratio in the wavelet domain
Ilić, Ljiljana, Pižurica, Aleksandra, Vansteenkiste, Ewout, Philips, Wilfried, Truchetet, Frederic, Laligant, OlivierVolume:
7248
Year:
2009
Language:
english
DOI:
10.1117/12.807412
File:
PDF, 795 KB
english, 2009