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SPIE Proceedings [SPIE International Conference on Optical Instrumentation and Technology - Shanghai, China (Monday 19 October 2009)] 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology - Determining the optimal imaging position in tomographic interference microscopy
Xue, Liang, Lai, Jian-cheng, Li, Zhen-hua, Yoshizawa, Toru, Wei, Ping, Zheng, JesseVolume:
7513
Year:
2009
Language:
english
DOI:
10.1117/12.837106
File:
PDF, 5.42 MB
english, 2009