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Dynamic-Pseudo-Random Test Sequence Generation Technique with Low Power Consumption
Zheng, Sheng Jia, Liu, Jian Jun, Li, Tie JunVolume:
474-476
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.474-476.655
Date:
April, 2011
File:
PDF, 267 KB
english, 2011