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ECS Transactions [ECS 219th ECS Meeting - Montreal, QC, Canada (May 1 - May 6, 2011)] - Electrical and Structural Properties of Ternary Rare-Earth Oxides on Si and Higher Mobility Substrates and their Integration as High-k Gate Dielectrics in MOSFET Devices
Lopes, J. Marcelo, Durğun Özben, Eylem, Schnee, Michael, Luptak, Roman, Nichau, Alexander, Tiedemann, Andreas, Yu, Wenjie, Zhao, Qing-Tai, Besmehn, Astrid, Breuer, Uwe, Luysberg, Martina, Lenk, St.,Year:
2011
Language:
english
DOI:
10.1149/1.3572299
File:
PDF, 1.34 MB
english, 2011