Measurement of dielectric properties at low temperatures:...

Journal of Physics Conference Series 2010 / 11 Vol. 253

Measurement of dielectric properties at low temperatures: application to the study of magnetoresistive manganite/ insulating oxide bulk composites

Vanderbemden, P, Rivas-Murias, B, Lovchinov, V, Vertruyen, B
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Volume:
253
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/253/1/012006
Date:
November, 2010
File:
PDF, 820 KB
english, 2010
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