![](/img/cover-not-exists.png)
A New Reliability Analysis Algorithm With Insufficient Uncertainty Data for Optimal Robust Design of Electromagnetic Devices
Ren, Ziyan, Cho, Hyunjin, Yeon, Junmo, Koh, Chang-SeopVolume:
51
Language:
english
Journal:
IEEE Transactions on Magnetics
DOI:
10.1109/TMAG.2014.2360753
Date:
March, 2015
File:
PDF, 1.10 MB
english, 2015