Development of Top-Gate Nanocrystalline Si:H Thin Film...

Development of Top-Gate Nanocrystalline Si:H Thin Film Transistors

McDonald, Jarrod, Dalal, Vikram L., Noack, Max
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Volume:
808
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-808-A9.37
Date:
January, 2004
File:
PDF, 234 KB
english, 2004
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