Fidelity and trace-norm distances for quantifying coherence
Shao, Lian-He, Xi, Zhengjun, Fan, Heng, Li, YongmingVolume:
91
Language:
english
Journal:
Physical Review A
DOI:
10.1103/physreva.91.042120
Date:
April, 2015
File:
PDF, 159 KB
english, 2015